Raytheon Senior Electrical Engineer - Semiconductor Device Reliability in Andover, Massachusetts

The Microelectronics Engineering and Technology (MET) department is seeking candidates for a position as a Senior Electrical Engineer I with experience with semiconductor device reliability to be part of a team to develop next generation microwave and millimeter wave GaN and GaAs semiconductor devices and circuits. The MET department designs and manufactures compound semiconductor devices, millimeter/microwave integrated circuits (MMICs) and modules for defense and commercial applications and is a part of Raytheon Electrical Engineering Directorate (EDD). In this role, the successful candidate will employ the following skills: Knowledge: Familiar with the area of device Reliability; have the ingenuity and resourcefulness to be able to develop advanced technologies and concepts. Discretion: Act independently and as part of a team to uncover and resolve issues. Vision: Support the development of METs strategic semiconductor reliability roadmaps, innovative measurements systems, and new characterization techniques. Impact: Provide the innovation and maturation of new technologies and concepts resulting in new product/business opportunities for Raytheon. Liaison: Report to program management and key spokesperson on reliably issues. Required Education and Experience: BSEE or device physics plus minimum of 4+ years of experience OR MSEE or device physics plus minimum of 2+ years of experience. Experience with RF and DC reliability measurements and /or stress testing on semiconductor GaN and GaAS devices. Experience with either Arrhenius, or FIT or MTTF data analysis Experience with Failure Mode Effect Analysis (FMEA) techniques Desired Skills: PhD in electrical engineering or device physics Capability to facilitate standard reliability tasks Ability to perform and advance device, circuit, and module reliability measurements Willingness to interact and support teams of device and circuit designers, device modeling engineers, failure analysis experts and test engineers Experience with on-wafer reliability testing techniques and device characterization Ability to obtain a security clearance Experience with identifying and understanding device failure mechanisms Experience using different types of die attach and carriers and knowledgeable on their effects on device reliability Experience with various failure analysis techniques including but not limited to electrical tests, visual inspections, Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), Focused Ion Beam (FIB) Statistical and data analysis background KEYWORDS: Reliability, RF, Microwave, Millimeter-wave, microelectronics, Senior Electrical Engineer, device physics 100134